1. Repositório Institucional da UFMG
  2. Publicações Científicas e Culturais
  3. Artigo de Periódico
Use este identificador para citar o ir al link de este elemento: http://hdl.handle.net/1843/56035
Registro completo de metadatos
Campo DCValorIdioma
dc.creatorThales Fernando Damasceno Fernandespt_BR
dc.creatorDouglas Rodrigues Miquitapt_BR
dc.creatorEder M. Soarespt_BR
dc.creatorAdelina Pinheiro Santospt_BR
dc.creatorLuiz Gustavo de Oliveira Lopes Cançadopt_BR
dc.creatorBernardo Ruegger Almeida Nevespt_BR
dc.date.accessioned2023-07-10T19:09:31Z-
dc.date.available2023-07-10T19:09:31Z-
dc.date.issued2020-
dc.citation.volume7pt_BR
dc.citation.issue2pt_BR
dc.citation.spage1pt_BR
dc.citation.epage7pt_BR
dc.identifier.doihttps://doi.org/10.1088/2053-1583/ab7975pt_BR
dc.identifier.issn2053-1583pt_BR
dc.identifier.urihttp://hdl.handle.net/1843/56035-
dc.description.resumoThe production of graphene flakes at industrial scale required the development of new fabrication strategies beyond conventional mechanical exfoliation such as Liquid Phase Exfoliation. This successful endeavor should have been matched by a similar development in the statistical analysis of the newly mass-produced material. However, flake quantification protocols kept relying mostly on the analysis of a few flakes only, resulting in conflicting and misleading analyses. Here, we propose a new AFM-based semi-automated protocol for the simultaneous analysis and quantification of thousands of flakes. It yields statistically relevant values for flake size and thickness distributions. Moreover, we include an important mass content parameter which is essential to separate otherwise statistically identical graphene-rich from graphite-rich samples. This new methodology opens a new path in the characterization of large-scale produced flakes enabling direct and trustful comparison between different graphene, or any other 2D material, products.pt_BR
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológicopt_BR
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Geraispt_BR
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)pt_BR
dc.languageengpt_BR
dc.publisherUniversidade Federal de Minas Geraispt_BR
dc.publisher.countryBrasilpt_BR
dc.publisher.departmentICX - DEPARTAMENTO DE FÍSICApt_BR
dc.publisher.initialsUFMGpt_BR
dc.rightsAcesso Restritopt_BR
dc.subjectGraphenept_BR
dc.subjectAtomic force microscopypt_BR
dc.subjectGraphitept_BR
dc.subjectLiquid phase exfoliationpt_BR
dc.subject.otherGrafenopt_BR
dc.subject.otherMicroscopia de força atômicapt_BR
dc.subject.otherGrafitapt_BR
dc.titleA semi-automated general statistical treatment of graphene systemspt_BR
dc.typeArtigo de Periódicopt_BR
dc.url.externahttps://iopscience.iop.org/article/10.1088/2053-1583/ab7975pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-3868-9029pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-5319-4652pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-0816-0888pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-0464-4754pt_BR
Aparece en las colecciones:Artigo de Periódico

archivos asociados a este elemento:
no existem archivos asociados a este elemento.
Mostrar registro simple del elemento Visualizar estadísticas


Los elementos en el repositorio están protegidos por copyright, con todos los derechos reservados, salvo cuando es indicado lo contrario.