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http://hdl.handle.net/1843/43662
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DC Field | Value | Language |
---|---|---|
dc.creator | João Luiz Elias Campos | pt_BR |
dc.creator | Hudson Luiz Silva de Miranda | pt_BR |
dc.creator | Cassiano Rabelo e Silva | pt_BR |
dc.creator | Emil Sandoz-Rosado | pt_BR |
dc.creator | Sugandha Dogra Pandey | pt_BR |
dc.creator | Juha Riikonen | pt_BR |
dc.creator | Abraham Guadalupe Cano-Márquez | pt_BR |
dc.creator | Ado Jorio de Vasconcelos | pt_BR |
dc.date.accessioned | 2022-07-26T17:16:35Z | - |
dc.date.available | 2022-07-26T17:16:35Z | - |
dc.date.issued | 2017-09-15 | - |
dc.citation.volume | 49 | pt_BR |
dc.citation.issue | 1 | pt_BR |
dc.citation.spage | 54 | pt_BR |
dc.citation.epage | 65 | pt_BR |
dc.identifier.doi | https://doi.org/10.1002/jrs.5225 | pt_BR |
dc.identifier.issn | 1097-4555 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/1843/43662 | - |
dc.description.resumo | A methodology for the structural analysis of graphene-related materials using parameterized principal component analysis (PCA), ideal for large-scale data treatment, is introduced. First, we review different aspects of Raman spectroscopy for structural and functional characterization of sp2-bonded carbon materials, which are important for understanding the problem. The parameterized PCA is then introduced and applied to 2 different scenarios: to identify different sp2 carbon structures and to identify graphene samples with different numbers of layers. Automating these Raman spectroscopy analysis techniques is desired for large-scale industrial applications. | pt_BR |
dc.description.sponsorship | CNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico | pt_BR |
dc.language | eng | pt_BR |
dc.publisher | Universidade Federal de Minas Gerais | pt_BR |
dc.publisher.country | Brasil | pt_BR |
dc.publisher.department | ICX - DEPARTAMENTO DE FÍSICA | pt_BR |
dc.publisher.initials | UFMG | pt_BR |
dc.relation.ispartof | Journal of Raman Spectroscopy | pt_BR |
dc.rights | Acesso Restrito | pt_BR |
dc.subject | Raman spectroscopy | pt_BR |
dc.subject | Principal component analysis | pt_BR |
dc.subject | Graphene | pt_BR |
dc.subject | Disorder | pt_BR |
dc.subject | Defect | pt_BR |
dc.subject.other | Grafeno | pt_BR |
dc.subject.other | Nanomateriais | pt_BR |
dc.subject.other | Espectroscopia de Raman | pt_BR |
dc.title | Applications of Raman spectroscopy in graphene-related materials and the development of parameterized PCA for large-scale data analysis | pt_BR |
dc.type | Artigo de Periódico | pt_BR |
dc.url.externa | https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/full/10.1002/jrs.5225 | pt_BR |
dc.identifier.orcid | https://orcid.org/0000-0002-8071-0525 | pt_BR |
dc.identifier.orcid | https://orcid.org/0000-0002-9946-5224 | pt_BR |
dc.identifier.orcid | https://orcid.org/0000-0003-0488-2242 | pt_BR |
dc.identifier.orcid | https://orcid.org/0000-0003-3123-2245 | pt_BR |
dc.identifier.orcid | https://orcid.org/0000-0002-7940-7270 | pt_BR |
dc.identifier.orcid | https://orcid.org/0000-0002-5978-2735 | pt_BR |
Appears in Collections: | Artigo de Periódico |
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