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Please use this identifier to cite or link to this item: http://hdl.handle.net/1843/45447
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dc.creatorAnna Gabriella Camacho Presottopt_BR
dc.creatorValentim Adelino Ricardo Barãopt_BR
dc.creatorRicardo Armini Caldaspt_BR
dc.creatorCláudia Lopes Brilhante Bheringpt_BR
dc.creatorRafael Leonardo Xediek Consanipt_BR
dc.creatorMarcelo Ferraz Mesquitapt_BR
dc.date.accessioned2022-09-24T17:37:43Z-
dc.date.available2022-09-24T17:37:43Z-
dc.date.issued2018-07-16-
dc.citation.volume17pt_BR
dc.citation.spage1pt_BR
dc.citation.epage13pt_BR
dc.identifier.doihttps://doi.org/10.20396/bjos.v17i0.8652941pt_BR
dc.identifier.issn16773225pt_BR
dc.identifier.urihttp://hdl.handle.net/1843/45447-
dc.description.resumoAim: To compare the reliability between photoelastic and finite element (FE) analyses by evaluating the effect of different marginal misfit levels on the stresses generated on two different implant-supported systems using conventional and short implants. Methods: Two photoelastic models were obtained: model C with two conventional implants (4.1×11 mm); and model S with a conventional and a short implant (5×6 mm). Three-unit CoCr frameworks were fabricated simulating a superior first pre-molar (P) to first molar (M) fixed dental prosthesis. Different levels of misfit (μm) were selected based on the misfit average of 10 frameworks obtained by the single-screw test protocol: low (<20), medium (>20 and <40) and high (>40). Stress levels and distribution were measured by photoelastic analysis. A similar situation of the in vitro assay was designed and simulated by the in silico analysis. Maximum and minimum principal strain were recorded numerically and color-coded for the models. Von Mises Stress was obtained for the metallic components. Results:Photoelasticity and FE analyses showed similar tendency where the increase of misfit generates higher stress levels despite of the implant design. The short implant showed lower von Mises stress values; however, it presented stresses around its full length for the in vitro and in silico analysis. Also, model S showed higher μstrain values for all simulated misfit levels. The type of implant did not affect the stresses around pillar P. Conclusions:Photoelasticity and FEA are reliable methodologies presenting similarity for the investigation of the biomechanical behavior of implant-supported rehabilitations.pt_BR
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superiorpt_BR
dc.description.sponsorshipFAPESP - Fundação de Amparo à Pesquisa do Estado de São Paulopt_BR
dc.format.mimetypepdfpt_BR
dc.languageengpt_BR
dc.publisherUniversidade Federal de Minas Geraispt_BR
dc.publisher.countryBrasilpt_BR
dc.publisher.departmentFAO - DEPARTAMENTO DE ODONTOLOGIA RESTAURADORApt_BR
dc.publisher.initialsUFMGpt_BR
dc.relation.ispartofBrazilian Journal of Oral Sciencespt_BR
dc.rightsAcesso Abertopt_BR
dc.subjectBiomechanical phenomenapt_BR
dc.subjectDental Implantspt_BR
dc.subjectOptical phenomenapt_BR
dc.subjectFinite element analysispt_BR
dc.subject.otherBiomechanical phenomenapt_BR
dc.subject.otherDental Implantspt_BR
dc.subject.otherOptical phenomenapt_BR
dc.subject.otherFinite element analysispt_BR
dc.titlePhotoelastic and finite element stress analysis reliability for implant-supported system stress investigationpt_BR
dc.typeArtigo de Periódicopt_BR
dc.url.externahttps://periodicos.sbu.unicamp.br/ojs/index.php/bjos/article/view/8652941/0pt_BR
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