Please use this identifier to cite or link to this item: http://hdl.handle.net/1843/51559
Type: Artigo de Periódico
Title: Scanning tunneling measurements in membrane-based nanostructures: spatially-resolved quantum state analysis in postprocessed epitaxial systems for optoelectronic applications
Authors: Bárbara Luiza Teixeira Rosa
Carlos Alberto Parra Murillo
Thais Chagas Peixoto Silva
Ailton José Garcia Junior
Paulo Sérgio Soares Guimarães
Christoph Friedrich Deneke
Rogério Magalhães Paniago
Ângelo Malachias de Souza
Abstract: Nanoscale heterostructure engineering is the main target for the development of optoelectronic devices. In this sense, a precise knowledge of local electronic response after materials processing is required to envisage technological applications. A number of local probe techniques that address single nanostructure signals were satisfactorily employed in semiconductor epitaxial systems. In this work we show that the use of chemically etched semiconductor nanomembranes allows carrying out scanning tunneling spectroscopy (STS) measurements in a postprocessed system which was otherwise studied mainly under in situ conditions that differ from the operational regime. We were able to acquire STS spectra with energy level resolved response on InAs quantum dots grown within a 15 nm-thick GaAs single-crystalline film transferred to an Au(111) surface. The presence of a native oxide layer does not affect the result, keeping the reliability of the usual ultra high vacuum (UHV) procedures. The use of nanomembranes also opens up the possibility of tailoring properties via additional variables such as nanomembrane thickness and surface charge depletion. Our method is applicable to a broad class of postprocessed layers extracted in nanomembrane format from epitaxial systems that are potential candidates for optoelectronic applications.
Subject: Pontos quânticos
Nanomembranas
Espectroscopia de tunelamento
language: eng
metadata.dc.publisher.country: Brasil
Publisher: Universidade Federal de Minas Gerais
Publisher Initials: UFMG
metadata.dc.publisher.department: ICX - DEPARTAMENTO DE FÍSICA
Rights: Acesso Restrito
metadata.dc.identifier.doi: https://doi.org/10.1021/acsanm.9b01124
URI: http://hdl.handle.net/1843/51559
Issue Date: 2019
metadata.dc.url.externa: https://pubs.acs.org/doi/10.1021/acsanm.9b01124
metadata.dc.relation.ispartof: ACS Applied Nano Materials
Appears in Collections:Artigo de Periódico

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