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Please use this identifier to cite or link to this item: http://hdl.handle.net/1843/54486
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dc.creatorLorena Aarão Rodriguespt_BR
dc.creatorAugusta Cerceau Isaac Netapt_BR
dc.creatorRoberto Braga Figueiredopt_BR
dc.creatorÂngelo Malachias de Souzapt_BR
dc.date.accessioned2023-06-05T12:12:29Z-
dc.date.available2023-06-05T12:12:29Z-
dc.date.issued2020-
dc.citation.volume53pt_BR
dc.citation.issue4pt_BR
dc.citation.spage1006pt_BR
dc.citation.epage1014pt_BR
dc.identifier.doihttps://doi.org/10.1107/S1600576720007803pt_BR
dc.identifier.issn1600-5767pt_BR
dc.identifier.urihttp://hdl.handle.net/1843/54486-
dc.description.resumoThe development of materials is strongly related to our capability of understanding thermal, mechanical and chemical processing on the nanoscale. Unravelling the interface structure is crucial for opening new regimes in property–performance space. Interface arrangements have been characterized by statistically limited microscopy techniques. In this work, a large-angularrange detector was used for synchrotron diffraction measurements on commercially pure Mg. Long acquisitions allowed the retrieval of preferred interface configurations through the observation of extraordinary diffraction peaks located close to the Mg 102, 200, 204 and 300 fundamental reflections. A kinematical simulation scanning possible interface structures established the correspondence of the non-bulk peaks to the interfacial organization of atoms that may be responsible for their appearance. Simulated interfaces were probed for a wide range of angular displacements with respect to the main cleavage planes. The results indicate configurations that allow the observation of X-ray diffraction, representing a long-range-ordered pattern of atomic distributions in Mg. The introduced methodology allows for nondestructive monitoring of systems that undergo processes that modify grain sizes and grain-interface orientation.pt_BR
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológicopt_BR
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Geraispt_BR
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superiorpt_BR
dc.languageengpt_BR
dc.publisherUniversidade Federal de Minas Geraispt_BR
dc.publisher.countryBrasilpt_BR
dc.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA METALÚRGICApt_BR
dc.publisher.departmentICX - DEPARTAMENTO DE FÍSICApt_BR
dc.publisher.initialsUFMGpt_BR
dc.relation.ispartofJournal of Applied Crystallography-
dc.rightsAcesso Restritopt_BR
dc.subjectX-ray diffractionpt_BR
dc.subjectSynchrotron radiationpt_BR
dc.subjectExtraordinary reflectionspt_BR
dc.subject.otherRaios X, difraçãopt_BR
dc.subject.otherRadiação sincrotrônicapt_BR
dc.subject.otherMateriais policristalinospt_BR
dc.titleRetrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X-ray reflection analysispt_BR
dc.typeArtigo de Periódicopt_BR
dc.url.externahttps://scripts.iucr.org/cgi-bin/paper?S1600576720007803pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-8617-0956pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-8703-4283pt_BR
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