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Please use this identifier to cite or link to this item: http://hdl.handle.net/1843/56034
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dc.creatorAna Paula Moreira Barbozapt_BR
dc.creatorJoyce Cristina da Cruz Santospt_BR
dc.creatorElisangela Silva Pintopt_BR
dc.creatorBernardo Ruegger Almeida Nevespt_BR
dc.date.accessioned2023-07-10T19:01:51Z-
dc.date.available2023-07-10T19:01:51Z-
dc.date.issued2019-
dc.citation.volume31pt_BR
dc.citation.issue11pt_BR
dc.citation.spage1pt_BR
dc.citation.epage4pt_BR
dc.identifier.doihttps://doi.org/10.1088/1361-6528/ab5dedpt_BR
dc.identifier.issn1361-6528pt_BR
dc.identifier.urihttp://hdl.handle.net/1843/56034-
dc.description.resumoGypsum is an Earth-abundant mineral with enormous applications in agriculture and civil engineering. Here, we show it is also an excellent height calibration standard alternative for atomic force microscopy (AFM). Using plain water as etchant, gypsum flakes readily review 0.75 nm tall terraces which are easy to image (lateral dimensions from tens to hundreds of nanometers) and robust against time in ambient conditions. Therefore, the present work demonstrates a new height standard alternative which is easily-available for all AFM microscopists around the world.pt_BR
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológicopt_BR
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Geraispt_BR
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superiorpt_BR
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)pt_BR
dc.languageengpt_BR
dc.publisherUniversidade Federal de Minas Geraispt_BR
dc.publisher.countryBrasilpt_BR
dc.publisher.departmentICX - DEPARTAMENTO DE FÍSICApt_BR
dc.publisher.initialsUFMGpt_BR
dc.relation.ispartofNanotechnology-
dc.rightsAcesso Restritopt_BR
dc.subjectAtomic force microscopypt_BR
dc.subjectHeight calibration standardpt_BR
dc.subjectGypsumpt_BR
dc.subject.otherMicroscopia de força atômicapt_BR
dc.subject.otherMineralpt_BR
dc.titleGypsum: an environment-friendly, inexpensive and robust height calibration standard at nanometre-scale for atomic force microscopypt_BR
dc.typeArtigo de Periódicopt_BR
dc.url.externahttps://iopscience.iop.org/article/10.1088/1361-6528/ab5dedpt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-1807-971Xpt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-0464-4754pt_BR
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