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http://hdl.handle.net/1843/80293| Type: | Artigo de Periódico |
| Title: | Twisted bilayer graphene: a versatile fabrication method and the detection of variable nanometric strain caused by twist-angle disorder |
| Authors: | Andreij de Carvalho Gadelha Takashi Taniguchi Cassiano Rabelo e Silva Pedro Paulo de Mello Venezuela Gilberto Medeiros Ribeiro Ado Jorio de Vasconcelos Luiz Gustavo de Oliveira Lopes Cançado Leonardo Cristiano Campos Douglas August Alexander Ohlberg Fabiano Costa Santana Eliel Gomes da Silva Neto Jéssica Santos Lemos Vinícius Ornelas da Silva Daniel de Abreu Miranda Rafael Battistella Nadas Kenji Watanabe |
| Abstract: | Twisted bilayer heterostructures (TBHs) are materials whose physical properties depend on the twist angle between the two layers of two-dimensional (2D) materials. Those heterostructures are not found in nature, and it is quite common to fabricate them with a nonhomogeneous twist angle, giving rise to the so-called twist-angle disorder. The most reliable method used to fabricate TBHs is the tear-and-stack method, which enables production of TBHs starting from a crystal of hexagonal boron nitride that works as a stamp. However, the twisted 2D materials stay attached to the boron nitride permanently. In this paper, we present a pyramid trunk stamp that enables a versatile and easy fabrication of twisted heterostructures without the aid of boron nitride crystals. The semipyramidal stamp enables good visualization of the 2D materials, easy alignments, and transfer of 2D materials between different substrates, and the same stamp can be reused for many fabrications. We demonstrate our method producing twisted bilayer graphene (TBG), and we present an investigation based on nano-Raman hyperspectral imaging, which can be implemented to characterize regions of TBG under twist-angle disorder, strain, or doping. |
| Subject: | Grafeno Microscopia de varredura por tunelamento |
| language: | eng |
| metadata.dc.publisher.country: | Brasil |
| Publisher: | Universidade Federal de Minas Gerais |
| Publisher Initials: | UFMG |
| metadata.dc.publisher.department: | ICX - DEPARTAMENTO DE CIÊNCIA DA COMPUTAÇÃO ICX - DEPARTAMENTO DE FÍSICA |
| Rights: | Acesso Restrito |
| metadata.dc.identifier.doi: | https://doi.org/10.1021/acsanm.0c03230 |
| URI: | http://hdl.handle.net/1843/80293 |
| Issue Date: | 2021 |
| metadata.dc.url.externa: | https://pubs.acs.org/doi/10.1021/acsanm.0c03230 |
| metadata.dc.relation.ispartof: | ACS Applied Nano Materials |
| Appears in Collections: | Artigo de Periódico |
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