Raman spectroscopy analysis of number of layers in mass-produced graphene flakes

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dc.creatorDiego L. Silva
dc.creatorOmar Paranaiba Vilela Neto
dc.creatorAdo Jorio de Vasconcelos
dc.creatorLuiz Gustavo de Oliveira Lopes Cançado
dc.creatorJoão Luiz Elias Campos
dc.creatorThales Fernando Damasceno Fernandes
dc.creatorJerônimo Nunes Rocha
dc.creatorLucas Resende Pellegrinelli Machado
dc.creatorEder M. Soares
dc.creatorDouglas Rodrigues Miquita
dc.creatorHudson Luiz Silva de Miranda
dc.creatorCassiano Rabelo e Silva
dc.date.accessioned2022-08-02T19:13:28Z
dc.date.accessioned2025-09-09T00:37:11Z
dc.date.available2022-08-02T19:13:28Z
dc.date.issued2020
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Gerais
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)
dc.identifier.doihttps://doi.org/10.1016/j.carbon.2020.01.050
dc.identifier.issn0008-6223
dc.identifier.urihttps://hdl.handle.net/1843/43896
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofCarbon
dc.rightsAcesso Restrito
dc.subjectEspectroscopia de Raman
dc.subjectGrafeno
dc.subject.otherGraphene
dc.subject.otherRaman spectroscopy
dc.subject.otherNumber of layers
dc.titleRaman spectroscopy analysis of number of layers in mass-produced graphene flakes
dc.typeArtigo de periódico
local.citation.epage189
local.citation.spage181
local.citation.volume161
local.description.resumoA metrological framework for statistical analysis of number of layers and stacking order in mass-produced graphene using Raman spectroscopy is presented. The method is based on two complementary protocols, denominated by 2D and G. The 2D–protocol is based on the parameterized principal component analysis of the two-phonon 2D band, and it measures interlayer coupling. A neural-network algorithm for spectral denoising was also developed to improve the outcome. The G–protocol explores the intensity of the bond-stretching G band, and provides information about the number of layers. The method is suitable for automated statistical analysis of heterogeneous graphene-based systems with relatively low computational cost, as shown here for graphene flakes prepared by the liquid-phase exfoliation of graphite.
local.identifier.orcidhttps://orcid.org/0000-0003-1769-0629
local.identifier.orcidhttps://orcid.org/0000-0002-5978-2735
local.identifier.orcidhttps://orcid.org/0000-0003-0816-0888
local.identifier.orcidhttps://orcid.org/0000-0002-8071-0525
local.identifier.orcidhttps://orcid.org/0000-0003-3868-9029
local.identifier.orcidhttps://orcid.org/0000-0002-1630-8005
local.identifier.orcidhttps://orcid.org/0000-0001-5319-4652
local.identifier.orcidhttps://orcid.org/0000-0002-9946-5224
local.identifier.orcidhttps://orcid.org/0000-0003-0488-2242
local.publisher.countryBrasil
local.publisher.departmentCMI - CENTRO DE MICROSCOPIA
local.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA ELÉTRICA
local.publisher.departmentICX - DEPARTAMENTO DE CIÊNCIA DA COMPUTAÇÃO
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://www.sciencedirect.com/science/article/pii/S0008622320300567#!

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