Automatic layout integration of bulk built-in current sensors for detection of soft errors

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dc.creatorMário Vinicius Guimaraes
dc.creatorFrank Sill Torres
dc.date.accessioned2025-03-24T14:04:23Z
dc.date.accessioned2025-09-09T00:04:32Z
dc.date.available2025-03-24T14:04:23Z
dc.date.issued2016
dc.identifier.doi10.1109/SBCCI.2016.7724073
dc.identifier.urihttps://hdl.handle.net/1843/80845
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.rightsAcesso Restrito
dc.subjectCircuitos integrados lineares
dc.subjectLinear integrated circuits - Design - Data processing
dc.subject.otherBulk Built-In-Current Sensors
dc.subject.otherBulk-BICS
dc.subject.otherReliability
dc.subject.otherVLSI/CAD Design
dc.titleAutomatic layout integration of bulk built-in current sensors for detection of soft errors
dc.typeArtigo de evento
local.citation.epage6
local.citation.spage1
local.description.resumoSoft error resilience is of rising importance for the design of integrated circuits realized in CMOS nanometer technologies. Therefore, Bulk Built-In Current Sensors (BBICS) have been proposed as a fast and efficient technique for detecting transient faults that might lead to soft errors. An important requirement for application of these sensors in common designs is the automatic integration. The aim of this work is to present a methodology for automatic insertion of BBICS in common standard cell designs. Further, two different placement strategies are introduced and compared. Experiments demonstrate the feasibility of the approach and indicate requirements for future BBICS developments in order to reduce area offset.
local.publisher.countryBrasil
local.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA ELETRÔNICA
local.publisher.initialsUFMG
local.url.externahttps://ieeexplore.ieee.org/document/7724073

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