Protocol and reference material for measuring the nanoantenna enhancement factor in tip-enhanced Raman spectroscopy
| dc.creator | Aroldo Ribeiro Lopes Neto | |
| dc.creator | Cassiano Rabelo e Silva | |
| dc.creator | Luiz Gustavo de Oliveira Lopes Cançado | |
| dc.creator | Michael Engel | |
| dc.creator | Mathias Bernhard Steiner | |
| dc.creator | Ado Jorio de Vasconcelos | |
| dc.date.accessioned | 2022-07-27T18:35:43Z | |
| dc.date.accessioned | 2025-09-08T23:15:42Z | |
| dc.date.available | 2022-07-27T18:35:43Z | |
| dc.date.issued | 2019 | |
| dc.identifier.doi | https://doi.org/10.1109/INSCIT.2019.8868468 | |
| dc.identifier.isbn | 978-1-7281-2109-3 | |
| dc.identifier.uri | https://hdl.handle.net/1843/43708 | |
| dc.language | eng | |
| dc.publisher | Universidade Federal de Minas Gerais | |
| dc.relation.ispartof | International Symposium on Instrumentation Systems, Circuits and Transducers - INSCIT | |
| dc.rights | Acesso Restrito | |
| dc.subject | Espectroscopia de Raman | |
| dc.subject | Espalhamento | |
| dc.subject.other | Reference material | |
| dc.subject.other | Novel materials and devices | |
| dc.subject.other | Tip-enhanced Raman spectroscopy | |
| dc.title | Protocol and reference material for measuring the nanoantenna enhancement factor in tip-enhanced Raman spectroscopy | |
| dc.type | Artigo de evento | |
| local.citation.epage | 6 | |
| local.citation.issue | 4 | |
| local.citation.spage | 1 | |
| local.description.resumo | There is up to date no agreement on what is the enhancement factor (fe) in tip-enhanced Raman Spectroscopy (TERS). The complexity resides both on the lack of a proper theoretical definition and of a reliable experimental procedure for measuring it. Here we propose a protocol and a reference material to characterize the intrinsic fe value of a TERS nanoantenna. The protocol is based on the theoretical description of the tip-sample approach curve, which should be performed in a reference material made of a well-defined near-field Raman scattering properties together with other specificities that allows measuring all the parameters necessary to fully optimize and characterize the measuring system. | |
| local.identifier.orcid | https://orcid.org/0000-0002-0214-867X | |
| local.identifier.orcid | https://orcid.org/0000-0003-0488-2242 | |
| local.identifier.orcid | https://orcid.org/0000-0003-0816-0888 | |
| local.identifier.orcid | https://orcid.org/0000-0002-5978-2735 | |
| local.publisher.country | Brasil | |
| local.publisher.department | ICX - DEPARTAMENTO DE FÍSICA | |
| local.publisher.initials | UFMG | |
| local.url.externa | https://ieeexplore.ieee.org/document/8868468/authors#authors |
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