International interlaboratory comparison of Raman spectroscopic analysis of CVD-grown graphene

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dc.creatorPiers Turner
dc.creatorAmaia Zurutuza
dc.creatorAndrea Mario Rossi
dc.creatorDiana Tran
dc.creatorDiego Edison Lopez Silva
dc.creatorDusan Losic
dc.creatorFarzaneh Farivar
dc.creatorHugo Kerdoncuff
dc.creatorHyuksang Kwon
dc.creatorJerome Pirart
dc.creatorJoão Luiz Elias Campos
dc.creatorKeith Paton
dc.creatorKiran Subhedar
dc.creatorLi-Lin Tay
dc.creatorLingling Ren
dc.creatorLuiz Gustavo de Oliveira Lopes Cançado
dc.creatorMatthieu Paillet
dc.creatorPaul Finnie
dc.creatorPei Lay Yap
dc.creatorRaul Arenal
dc.creatorSanjay Rangnate Dhakate
dc.creatorSebastian Wood
dc.creatorElizabeth Legge
dc.creatorSergio Joaquin Jiménez Sandoval
dc.creatorTim Batten
dc.creatorVaiva Nagyte
dc.creatorYaxuan Yao
dc.creatorAngela Renee Hight Walker
dc.creatorErlon Henrique Martins Ferreira
dc.creatorCinzia Casiraghi
dc.creatorAndrew John Pollard
dc.creatorAndres de Luna Bugallo
dc.creatorAna Rocha-Robledo
dc.creatorAhmed Azmi Zahab
dc.creatorAlba Centeno
dc.creatorAlessio Sacco
dc.creatorAmaia Pesquera
dc.date.accessioned2025-04-30T17:27:53Z
dc.date.accessioned2025-09-09T00:02:57Z
dc.date.available2025-04-30T17:27:53Z
dc.date.issued2022
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Gerais
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
dc.identifier.doihttps://doi.org/10.1088/2053-1583/ac6cf3
dc.identifier.issn2053-1583
dc.identifier.urihttps://hdl.handle.net/1843/81989
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofIOPscience
dc.rightsAcesso Restrito
dc.subjectGrafeno
dc.subjectEspectroscopia de Raman
dc.subjectDeposição química de vapor
dc.subjectIncerteza
dc.subject.otherGraphene
dc.subject.otherRaman spectroscopy
dc.subject.otherChemical vapour deposition
dc.subject.otherUncertainty
dc.subject.otherVAMAS
dc.subject.otherStandardisation
dc.subject.otherInterlaboratory study
dc.titleInternational interlaboratory comparison of Raman spectroscopic analysis of CVD-grown graphene
dc.typeArtigo de periódico
local.citation.epage16
local.citation.issue3
local.citation.spage1
local.citation.volume9
local.description.resumoThere is a pressing need for reliable, reproducible and accurate measurements of graphene's properties, through international standards, to facilitate industrial growth. However, trustworthy and verified standards require rigorous metrological studies, determining, quantifying and reducing the sources of measurement uncertainty. Towards this effort, we report the procedure and the results of an international interlaboratory comparison (ILC) study, conducted under Versailles Project on Advanced Materials and Standards. This ILC focusses on the comparability of Raman spectroscopy measurements of chemical vapour deposition (CVD) grown graphene using the same measurement protocol across different institutes and laboratories. With data gathered from 17 participants across academia, industry (including instrument manufacturers) and national metrology institutes, this study investigates the measurement uncertainty contributions from both Raman spectroscopy measurements and data analysis procedures, as well as provides solutions for improved accuracy and precision. While many of the reported Raman metrics were relatively consistent, significant and meaningful outliers occurred due to differences in the instruments and data analysis. These variations resulted in inconsistent reports of peak intensity ratios, peak widths and the coverage of graphene. Due to a lack of relative intensity calibration, the relative difference reported in the 2D- and G peak intensity ratios () was up to 200%. It was also shown that the standard deviation for values reported by different software packages, was 15× larger for Lorentzian fit functions than for pseudo-Voigt functions. This study has shown that by adopting a relative intensity calibration and consistent peak fitting and data analysis methodologies, these large, and previously unquantified, variations can be significantly reduced, allowing more reproducible and comparable measurements for the graphene community, supporting fundamental research through to the growing graphene industry worldwide. This project and its findings directly underpin the development of the ISO/IEC standard 'DTS 21356-2—Nanotechnologies—Structural Characterisation of CVD-grown Graphene'.
local.identifier.orcidhttps://orcid.org/0000-0002-3644-0636
local.identifier.orcidhttps://orcid.org/0000-0001-6376-0224
local.identifier.orcidhttps://orcid.org/0000-0001-5638-7978
local.identifier.orcidhttps://orcid.org/0000-0002-7073-1226
local.identifier.orcidhttps://orcid.org/0000-0002-1930-072X
local.identifier.orcidhttps://orcid.org/0000-0003-2893-5927
local.identifier.orcidhttps://orcid.org/0000-0002-7774-5946
local.identifier.orcidhttps://orcid.org/0000-0002-8071-0525
local.identifier.orcidhttps://orcid.org/0000-0003-0300-8676
local.identifier.orcidhttps://orcid.org/0000-0002-3589-9090
local.identifier.orcidhttps://orcid.org/0000-0003-3408-3636
local.identifier.orcidhttps://orcid.org/0000-0002-9804-7303
local.identifier.orcidhttps://orcid.org/0000-0003-0816-0888
local.identifier.orcidhttps://orcid.org/0000-0001-7038-9101
local.identifier.orcidhttps://orcid.org/0000-0001-7346-8139
local.identifier.orcidhttps://orcid.org/0000-0002-2071-9093
local.identifier.orcidhttps://orcid.org/0000-0001-9971-1117
local.identifier.orcidhttps://orcid.org/0000-0002-8574-0475
local.identifier.orcidhttps://orcid.org/0000-0002-3432-4017
local.identifier.orcidhttps://orcid.org/0000-0002-2143-3759
local.identifier.orcidhttps://orcid.org/0000-0003-0835-6039
local.identifier.orcidhttps://orcid.org/0000-0002-0943-6148
local.identifier.orcidhttps://orcid.org/0000-0001-7185-0377
local.identifier.orcidhttps://orcid.org/0000-0002-6841-2592
local.identifier.orcidhttps://orcid.org/0000-0002-7591-5235
local.identifier.orcidhttps://orcid.org/0000-0003-4421-840X
local.publisher.countryBrasil
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://iopscience.iop.org/article/10.1088/2053-1583/ac6cf3

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