Observation of moiré superlattices on twisted bilayer graphene by scanning microwave impedance microscopy

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dc.creatorDouglas August Alexander Ohlberg
dc.creatorCássio Gonçalves do Rego
dc.creatorAdo Jorio de Vasconcelos
dc.creatorGilberto Medeiros Ribeiro
dc.creatorAndreij de Carvalho Gadelha
dc.creatorDiego Camilo Tami López
dc.creatorEliel Gomes da Silva Neto
dc.creatorDaniel A. Miranda
dc.creatorJéssica Santos Lemos
dc.creatorFabiano Costa Santana
dc.creatorLeonardo Cristiano Campos
dc.creatorJhonattan Córdoba Ramírez
dc.date.accessioned2022-08-08T11:55:38Z
dc.date.accessioned2025-09-08T22:54:46Z
dc.date.available2022-08-08T11:55:38Z
dc.date.issued2020
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Gerais
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
dc.description.sponsorshipFINEP - Financiadora de Estudos e Projetos, Financiadora de Estudos e Projetos
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)
dc.identifier.doihttps://doi.org/10.1117/12.2570651
dc.identifier.urihttps://hdl.handle.net/1843/44021
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofSPIE Nanoscience + Engineering
dc.rightsAcesso Restrito
dc.subjectGrafeno
dc.subjectMicroscopia
dc.subject.otherMicrowave impedance microscopy
dc.subject.otherBilayer graphene
dc.subject.otherMoiré pattern
dc.subject.otherMicroscopy
dc.titleObservation of moiré superlattices on twisted bilayer graphene by scanning microwave impedance microscopy
dc.typeArtigo de evento
local.citation.epage7
local.citation.spage1
local.description.resumoIn the emerging field of twistronics, new electronic devices based on bilayer graphene have shown distinct electronic properties that depend on the rotational misalignment of one crystalline layer with respect to another. Given present methods of preparing these bilayers, there is always some uncertainty in the actual versus targeted twist angle of a specific bilayer that can only be resolved by measuring the moiré patterns that are unique to a specific twist angle. Traditional methods enabling such a measurement, Transmission Electron Microscopy and Scanning Tunneling Microscopy, impose serious restrictions on the types of substrates supporting the bilayers, which, in turn, constrains the subsequent fabrication of any devices. We report here a new, non-destructive method to measure moiré patterns of bilayer graphene deposited on any smooth substrate, using the scanning probe technique known as scanning microwave impedance microscopy (sMIM) which enables the simultaneous generation of localized topography, capacitance and conductance images with nanometer scale resolution1. Moiré patterns were observed in samples prepared on various substrates with twist angles ranging from 0.02 to 6.7 degrees, beyond which the moiré patterns are too small to be resolved by the sMIM probes. We present some possible reasons for the various contrast mechanisms. Addressing the problem of variations across a bilayer surface due to localized moiré distortions that result from the tensile and shear forces involved in transferring a twisted bilayer to a substrate, we demonstrate how sMIM can precisely map the twist angle distribution across the film, and enable direct device and circuit routing.
local.identifier.orcidhttps://orcid.org/0000-0003-1634-0264
local.identifier.orcidhttps://orcid.org/0000-0002-0388-8688
local.identifier.orcidhttps://orcid.org/0000-0002-5978-2735
local.identifier.orcidhttps://orcid.org/0000-0001-5309-2488
local.identifier.orcidhttps://orcid.org/0000-0002-6350-7680
local.identifier.orcidhttps://orcid.org/0000-0002-1239-3222
local.identifier.orcidhttps://orcid.org/0000-0002-4658-3243
local.identifier.orcidhttps://orcid.org/0000-0001-6792-7554
local.identifier.orcidhttps://orcid.org/0000-0002-8883-4223
local.publisher.countryBrasil
local.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA ELÉTRICA
local.publisher.departmentICX - DEPARTAMENTO DE CIÊNCIA DA COMPUTAÇÃO
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/11465/114650J/Observation-of-moir%C3%A9-superlattices-on-twisted-bilayer-graphene-by-scanning/10.1117/12.2570651.full?webSyncID=026d873b-139a-c658-4444-37c22323c473&sessionGUID=7981396&SSO=1

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