Exfoliation and characterization of a two-dimensional serpentine-based material
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Universidade Federal de Minas Gerais
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We report on an experimental investigation of serpentine, an abundant phyllosilicate, as an
alternative source of two-dimensional (2D) nanomaterials. We show, through scanning probe
microscopy (SPM) measurements, that natural serpentine mineral can be mechanically exfoliated
down to few-layer flakes, where monolayers can be easily resolved. The parent serpentine bulk
material was initially characterized via conventional techniques like XRD, XPS, FTIR and
Raman spectroscopies and the results show that it is predominantly constituted by the antigorite
mineral. From ab initio calculations using density functional theory, we also determine the
geometry and electronic structure of antigorite, the observed structural form of serpentine.
Additionally, we further characterized electrical and mechanical properties of the obtained 2D
material flakes using SPM and broadband synchrotron infrared nanospectroscopy. Wavelength
tuning of the serpentine vibrational resonances, assigned to in- and out-of-plane molecular
vibrations, are observed and compared with the FTIR characterization of the parent bulk
material. They show that there is no degradation of serpentine’s structural properties during its
mechanical exfoliation down to nanometer-thin sheets. Therefore, our results introduce the
serpentine mineral as an attractive low-cost candidate in 2D materials applications.
Abstract
Assunto
Serpentina (Mineralogia), Scanning probe microscopy
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Serpentine mineral, Antigorite, Mechanical exfoliation, 2D materials, Scanning probe microscopy
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https://iopscience.iop.org/article/10.1088/1361-6528/ab3732