Redundancy design for modular multilevel converter based STATCOMs
| dc.creator | João Victor Matos Farias | |
| dc.creator | Allan F. Cupertino | |
| dc.creator | Victor de Nazareth Ferreira | |
| dc.creator | Heverton A. Pereira | |
| dc.creator | Seleme Isaac Seleme Jr | |
| dc.date.accessioned | 2025-05-15T13:04:02Z | |
| dc.date.accessioned | 2025-09-08T23:36:52Z | |
| dc.date.available | 2025-05-15T13:04:02Z | |
| dc.date.issued | 2019 | |
| dc.identifier.doi | https://doi.org/10.1016/j.microrel.2019.113471 | |
| dc.identifier.issn | 00262714 | |
| dc.identifier.uri | https://hdl.handle.net/1843/82285 | |
| dc.language | eng | |
| dc.publisher | Universidade Federal de Minas Gerais | |
| dc.relation.ispartof | Microelectronics Reliability | |
| dc.rights | Acesso Restrito | |
| dc.subject | Conversores eletrônicos | |
| dc.subject.other | Modular Multilevel Converters, Reliability, Redundancy Design, Wear-out Failures, Random Failures | |
| dc.subject.other | Modular multilevel converter (MMC) is considered the next generation of converter for medium and high voltage applications. Among the MMC topologies, the single-delta bridge cell (SDBC) is generally used in STATCOM and energy storage applications. Moreover, the double-star chopper cells (DSCC) is widely employed in STATCOM, HVDC and in some applications from electrical drives systems. The MMC topologies consist of the cascaded connection of low voltage bridges, aiming to achieve a high voltage capability. Nevertheless, in some applications, it is necessary to associate a large number of cells, compromising the system-level reliability. | |
| dc.title | Redundancy design for modular multilevel converter based STATCOMs | |
| dc.type | Artigo de periódico | |
| local.citation.spage | 113471 | |
| local.citation.volume | 100-101 | |
| local.description.resumo | Many strategies have been proposed to improve the reliability of Modular Multilevel Converters (MMCs). However, the redundancy factor selection to support a converter fault tolerance operation is an important field to be explored. This work proposes a combined reliability model for the correct selection of the additional number of cells to achieve a target lifetime. This model combines both wear-out and random failures data and compute the required redundancy factor for a given reliability target. The proposed model is evaluated through a reliability-oriented case study, whereas four device voltage classes in a 13.8 kV/17 MVA MMC STATCOM are considered. | |
| local.publisher.country | Brasil | |
| local.publisher.department | ENG - DEPARTAMENTO DE ENGENHARIA ELÉTRICA | |
| local.publisher.department | ENG - DEPARTAMENTO DE ENGENHARIA ELETRÔNICA | |
| local.publisher.initials | UFMG | |
| local.url.externa | https://www.sciencedirect.com/science/article/pii/S0026271419304184 |
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