Quasi-trapezoidal microstrip spherical patches and arrays

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dc.creatorLeonardo A. Costa
dc.creatorFernando José da Silva Moreira
dc.creatorOdilon Maroja da Costa Pereira-Filho
dc.date.accessioned2025-03-26T13:13:01Z
dc.date.accessioned2025-09-08T23:59:19Z
dc.date.available2025-03-26T13:13:01Z
dc.date.issued2016
dc.identifier.doi10.1049/iet-map.2015.0145
dc.identifier.issn1751-8725
dc.identifier.urihttps://hdl.handle.net/1843/80927
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofIET Microwaves, Antennas & Propagation
dc.rightsAcesso Aberto
dc.subjectEngenharia Elétrica
dc.subjectAntenas (Eletronica)
dc.subjectAntenas refletoras
dc.subjectEletromagnetismo
dc.subjectGalerkin, Métodos de
dc.subjectOtimização matemática
dc.subject.otherAntenas de Microfita
dc.subject.otherAntenas Impressas
dc.subject.otherSíntese e Análise de Antenas
dc.subject.otherMétodos Numéricos em Eletromagnetismo
dc.subject.otherTeoria Eletromagnética Aplicada
dc.subject.otherTelecomunicações
dc.subject.otheranalysis of quasi-trapezoidal spherical patches using full-domain basis functions
dc.titleQuasi-trapezoidal microstrip spherical patches and arrays
dc.typeArtigo de periódico
local.citation.epage60
local.citation.issue1
local.citation.spage53
local.citation.volume10
local.description.resumoThis study presents a full-wave analysis of quasi-trapezoidal microstrip spherical patches and arrays. It uses method of moments to evaluate the effect of the shape of the patches on the input impedance, bandwidth, mutual impedance, and radiation pattern. Arrays of quasi-trapezoidal patches are also analysed. Presents a procedure for avoiding numerical problems on evaluating combinations of Schelkunoff Bessel functions. Results are compared with previously published ones for the quasi-rectangular case for validation.
local.publisher.countryBrasil
local.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA ELETRÔNICA
local.publisher.initialsUFMG
local.url.externahttps://ietresearch.onlinelibrary.wiley.com/doi/full/10.1049/iet-map.2015.0145

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