Voids in kesterites and the influence of lamellae preparation by focused ion beam for transmission electron microscopy analyses

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dc.creatorRodrigo Ribeiro de Andrade
dc.creatorSylvester Sahayaraj
dc.creatorBart Vermang
dc.creatorMaria Rosário Pimenta Correia
dc.creatorSascha Sadewasser
dc.creatorJuan Carlos González Pérez
dc.creatorPaulo A. Fernandes
dc.creatorPedro M. P. Salomé
dc.date.accessioned2025-02-25T13:04:23Z
dc.date.accessioned2025-09-08T23:38:05Z
dc.date.available2025-02-25T13:04:23Z
dc.date.issued2019
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Gerais
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
dc.identifier.doihttps://doi.org/10.1109/JPHOTOV.2018.2889602
dc.identifier.issn2156-3403
dc.identifier.urihttps://hdl.handle.net/1843/80405
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofIEEE Journal of Photovoltaics
dc.rightsAcesso Restrito
dc.subjectFilmes finos
dc.subjectCélulas solares
dc.subjectMicroscopia eletrônica de transmissão
dc.subject.otherKesterite
dc.subject.otherThin films
dc.subject.otherSolar cells
dc.subject.otherTransmission electron microscopy
dc.titleVoids in kesterites and the influence of lamellae preparation by focused ion beam for transmission electron microscopy analyses
dc.typeArtigo de periódico
local.citation.epage570
local.citation.issue2
local.citation.spage565
local.citation.volume9
local.description.resumoKesterite solar cells based on Cu 2 ZnSnS 4 and Cu 2 ZnSnSe 4 (CZTSe) are potential future candidates to be used in thin-film solar cells. The technology still has to be developed to a great extent and for this to happen, high levels of confidence in the characterization methods are required, so that improvements can be made on solid interpretations. In this study, we show that the interpretations of one of the most used characterization techniques in kesterites, scanning transmission electron microscopy (STEM), might be affected by its specimen preparation when using focused ion beam (FIB). Using complementary measurements based on scanning electron microscopy and Raman scattering spectroscopy, compelling evidence shows that secondary phases of ZnSe mixed in the bulk of CZTSe are the likely cause of the appearance of voids in STEM lamellae. Sputtering simulations support this interpretation by showing that Zn in a ZnSe matrix is preferentially sputtered compared with any metal atom in a CZTSe matrix.
local.identifier.orcidhttps://orcid.org/0000-0003-2669-2087
local.identifier.orcidhttps://orcid.org/0000-0003-3781-0085
local.identifier.orcidhttps://orcid.org/0000-0001-8384-6025
local.identifier.orcidhttps://orcid.org/0000-0001-9155-1657
local.identifier.orcidhttps://orcid.org/0000-0002-1050-2958
local.publisher.countryBrasil
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://ieeexplore.ieee.org/document/8610192

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