Near-field coherence reveals defect densities in atomic monolayers
Carregando...
Data
Título da Revista
ISSN da Revista
Título de Volume
Editor
Universidade Federal de Minas Gerais
Descrição
Tipo
Artigo de periódico
Título alternativo
Primeiro orientador
Membros da banca
Resumo
The ability to control the light-matter interaction in the deep subwavelength regime has fascinating consequences for material sciences and a range of photonics technologies. The statistical properties of emerging fields strongly depend on both the source of radiation and specific characteristics of the material system. Here we consider the coherence properties
in the proximity of surfaces illuminated by strongly randomized optical fields and demonstrate that the spatial extent of near-field correlations depends on the density of defects in two-dimensional crystalline lattices. We also show that this effect can be used as an efficient elastic scattering method to characterize the density of defects in two-dimensional crystalline materials. Systematic experiments demonstrate the relationship between the spatial coherence length of scat-
tered light and a characteristic length associated with structural disorder in graphene. The fact that one single layer of atoms can modify properties of electromagnetic radiation could lead to new means of controlling light at subwavelength scales and has implications for the emerging field of two-dimensional materials.
Abstract
Assunto
Ótica, Microscopia
Palavras-chave
Statistical optics, Coherence and statistical optics, Near-field microscopy
Citação
Departamento
Curso
Endereço externo
https://opg.optica.org/optica/fulltext.cfm?uri=optica-4-5-527&id=363693#top