A semi-automated general statistical treatment of graphene systems

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dc.creatorThales Fernando Damasceno Fernandes
dc.creatorDouglas Rodrigues Miquita
dc.creatorEder M. Soares
dc.creatorAdelina Pinheiro Santos
dc.creatorLuiz Gustavo de Oliveira Lopes Cançado
dc.creatorBernardo Ruegger Almeida Neves
dc.date.accessioned2023-07-10T19:09:31Z
dc.date.accessioned2025-09-09T00:17:43Z
dc.date.available2023-07-10T19:09:31Z
dc.date.issued2020
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Gerais
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)
dc.identifier.doihttps://doi.org/10.1088/2053-1583/ab7975
dc.identifier.issn2053-1583
dc.identifier.urihttps://hdl.handle.net/1843/56035
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.rightsAcesso Restrito
dc.subjectGrafeno
dc.subjectMicroscopia de força atômica
dc.subjectGrafita
dc.subject.otherGraphene
dc.subject.otherAtomic force microscopy
dc.subject.otherGraphite
dc.subject.otherLiquid phase exfoliation
dc.titleA semi-automated general statistical treatment of graphene systems
dc.typeArtigo de periódico
local.citation.epage7
local.citation.issue2
local.citation.spage1
local.citation.volume7
local.description.resumoThe production of graphene flakes at industrial scale required the development of new fabrication strategies beyond conventional mechanical exfoliation such as Liquid Phase Exfoliation. This successful endeavor should have been matched by a similar development in the statistical analysis of the newly mass-produced material. However, flake quantification protocols kept relying mostly on the analysis of a few flakes only, resulting in conflicting and misleading analyses. Here, we propose a new AFM-based semi-automated protocol for the simultaneous analysis and quantification of thousands of flakes. It yields statistically relevant values for flake size and thickness distributions. Moreover, we include an important mass content parameter which is essential to separate otherwise statistically identical graphene-rich from graphite-rich samples. This new methodology opens a new path in the characterization of large-scale produced flakes enabling direct and trustful comparison between different graphene, or any other 2D material, products.
local.identifier.orcidhttps://orcid.org/0000-0003-3868-9029
local.identifier.orcidhttps://orcid.org/0000-0001-5319-4652
local.identifier.orcidhttps://orcid.org/0000-0003-0816-0888
local.identifier.orcidhttps://orcid.org/0000-0003-0464-4754
local.publisher.countryBrasil
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://iopscience.iop.org/article/10.1088/2053-1583/ab7975

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