Twisted bilayer graphene: a versatile fabrication method and the detection of variable nanometric strain caused by twist-angle disorder

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dc.creatorAndreij de Carvalho Gadelha
dc.creatorTakashi Taniguchi
dc.creatorCassiano Rabelo e Silva
dc.creatorPedro Paulo de Mello Venezuela
dc.creatorGilberto Medeiros Ribeiro
dc.creatorAdo Jorio de Vasconcelos
dc.creatorLuiz Gustavo de Oliveira Lopes Cançado
dc.creatorLeonardo Cristiano Campos
dc.creatorDouglas August Alexander Ohlberg
dc.creatorFabiano Costa Santana
dc.creatorEliel Gomes da Silva Neto
dc.creatorJéssica Santos Lemos
dc.creatorVinícius Ornelas da Silva
dc.creatorDaniel de Abreu Miranda
dc.creatorRafael Battistella Nadas
dc.creatorKenji Watanabe
dc.date.accessioned2025-02-21T13:16:24Z
dc.date.accessioned2025-09-08T23:23:10Z
dc.date.available2025-02-21T13:16:24Z
dc.date.issued2021
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Gerais
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)
dc.description.sponsorshipFAPERJ - Fundação Carlos Chagas Filho de Amparo à Pesquisa do Estado do Rio de Janeiro
dc.identifier.doihttps://doi.org/10.1021/acsanm.0c03230
dc.identifier.issn2574-0970
dc.identifier.urihttps://hdl.handle.net/1843/80293
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofACS Applied Nano Materials
dc.rightsAcesso Restrito
dc.subjectGrafeno
dc.subjectMicroscopia de varredura por tunelamento
dc.subject.otherTwisted bilayer graphene
dc.subject.otherTear-and-stack method
dc.subject.otherStrain
dc.subject.otherScanning microwave impedance microscopy
dc.subject.otherScanning tunneling microscopy
dc.subject.otherNano-Raman
dc.titleTwisted bilayer graphene: a versatile fabrication method and the detection of variable nanometric strain caused by twist-angle disorder
dc.typeArtigo de periódico
local.citation.epage1866
local.citation.issue2
local.citation.spage1858
local.citation.volume4
local.description.resumoTwisted bilayer heterostructures (TBHs) are materials whose physical properties depend on the twist angle between the two layers of two-dimensional (2D) materials. Those heterostructures are not found in nature, and it is quite common to fabricate them with a nonhomogeneous twist angle, giving rise to the so-called twist-angle disorder. The most reliable method used to fabricate TBHs is the tear-and-stack method, which enables production of TBHs starting from a crystal of hexagonal boron nitride that works as a stamp. However, the twisted 2D materials stay attached to the boron nitride permanently. In this paper, we present a pyramid trunk stamp that enables a versatile and easy fabrication of twisted heterostructures without the aid of boron nitride crystals. The semipyramidal stamp enables good visualization of the 2D materials, easy alignments, and transfer of 2D materials between different substrates, and the same stamp can be reused for many fabrications. We demonstrate our method producing twisted bilayer graphene (TBG), and we present an investigation based on nano-Raman hyperspectral imaging, which can be implemented to characterize regions of TBG under twist-angle disorder, strain, or doping.
local.identifier.orcidhttps://orcid.org/0000-0002-6350-7680
local.identifier.orcidhttps://orcid.org/0000-0002-1467-3105
local.identifier.orcidhttps://orcid.org/0000-0003-0488-2242
local.identifier.orcidhttps://orcid.org/0000-0002-4166-2487
local.identifier.orcidhttps://orcid.org/0000-0001-5309-2488
local.identifier.orcidhttps://orcid.org/0000-0002-5978-2735
local.identifier.orcidhttps://orcid.org/0000-0003-0816-0888
local.identifier.orcidhttps://orcid.org/0000-0001-6792-7554
local.identifier.orcidhttps://orcid.org/0000-0003-1634-0264
local.identifier.orcidhttps://orcid.org/0000-0002-2169-5521
local.identifier.orcidhttps://orcid.org/0000-0002-4658-3243
local.identifier.orcidhttps://orcid.org/0000-0002-9493-9240
local.identifier.orcidhttps://orcid.org/0000-0002-3636-7272
local.identifier.orcidhttps://orcid.org/0000-0002-9784-3340
local.identifier.orcidhttps://orcid.org/0000-0001-6165-5981
local.identifier.orcidhttps://orcid.org/0000-0003-3701-8119
local.publisher.countryBrasil
local.publisher.departmentICX - DEPARTAMENTO DE CIÊNCIA DA COMPUTAÇÃO
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://pubs.acs.org/doi/10.1021/acsanm.0c03230

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