Electron backscatter diffraction (EBSD) sample preparation revisited: integrating traditional methods and new techniques in the last three decades

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dc.creatorTeodoro Gauzzi Rodrigues de Araújo
dc.creatorMarcelo da Cruz Costa de Souza
dc.creatorGuilherme Cardeal Stumpf
dc.creatorKarla Balzuweit
dc.date.accessioned2025-02-26T12:59:27Z
dc.date.accessioned2025-09-08T22:54:21Z
dc.date.available2025-02-26T12:59:27Z
dc.date.issued2020
dc.format.mimetypepdf
dc.identifier.issn0798-4545
dc.identifier.urihttps://hdl.handle.net/1843/80448
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofActa Microscópica
dc.rightsAcesso Aberto
dc.subjectLigas
dc.subjectMinerais
dc.subject.otherEBSD
dc.subject.otherFIB milling
dc.subject.otherThin foil preparation
dc.subject.otherMinerals
dc.subject.otherAlloys
dc.titleElectron backscatter diffraction (EBSD) sample preparation revisited: integrating traditional methods and new techniques in the last three decades
dc.typeArtigo de periódico
local.citation.epage120
local.citation.issue2
local.citation.spage106
local.citation.volume29
local.description.resumoElectron backscatter diffraction (EBSD) is an extremely powerful tool for analyzing the structure of mater. Sample preparation of heterogeneous materials as metallic alloys and minerals where grains with different physical and chemical characteristics has always been a challenge, being sometimes the main reason for the failure of the analysis. The present article intends to present to the reader a small survey of the most common EBSD sample preparation techniques and some of the newest advances in the area, as well references for further reading, though not being exhaustive as a review paper. Conventional techniques such as mechanical polishing and electropolishing as well as the more recent ion milling techniques using broad beam and the focused ion beam microscopes (FIB), are briefly presented and discussed.
local.identifier.orcidhttps://orcid.org/0000-0002-4020-3780
local.identifier.orcidhttps://orcid.org/0000-0002-9457-1968
local.identifier.orcidhttps://orcid.org/0000-0001-7124-4545
local.publisher.countryBrasil
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://acta-microscopica.org/acta/article/view/543

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