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Friction coefficient mapping of 2D materials via friction-induced topographic artifact in atomic force microscopy

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dc.creatorThales Fernando Damasceno Fernandes
dc.creatorBernardo Ruegger Almeida Neves
dc.date.accessioned2023-07-10T12:38:48Z
dc.date.accessioned2025-09-09T00:29:05Z
dc.date.available2023-07-10T12:38:48Z
dc.date.issued2016
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Gerais
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)
dc.format.mimetypepdf
dc.identifier.doihttps://dx.doi.org/10.22606/jan.2016.12004
dc.identifier.issn25191004
dc.identifier.urihttps://hdl.handle.net/1843/55984
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofJournal of Advances in Nanomaterials
dc.rightsAcesso Aberto
dc.subjectMicroscopia de força atômica
dc.subject.otherAtomic force microscopy
dc.subject.otherContact-mode
dc.subject.otherFriction coefficient
dc.subject.otherEuler-Bernoulli equation
dc.subject.other2D materials
dc.titleFriction coefficient mapping of 2D materials via friction-induced topographic artifact in atomic force microscopy
dc.typeArtigo de periódico
local.citation.epage81
local.citation.issue2
local.citation.spage73
local.citation.volume1
local.description.resumoThis work explores an atomic force microscopy artifact that yields different topographic data depending on the scanning direction in contact mode. Such artifact is associated with differences in friction coefficients across the sample, which leads to up to 500% difference in topographic data of 2D materials. An analytical theory is used to explain quantitatively this artifact. Nevertheless, on the bright side, such artifact also yields a straightforward methodology, which effectively maps friction coefficients across any 2D material without the need of cantilever spring constant calibration.
local.identifier.orcidhttps://orcid.org/0000-0003-3868-9029
local.identifier.orcidhttps://orcid.org/0000-0003-0464-4754
local.publisher.countryBrasil
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://dx.doi.org/10.22606/jan.2016.12004

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