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http://hdl.handle.net/1843/43896| Tipo: | Artigo de Periódico |
| Título: | Raman spectroscopy analysis of number of layers in mass-produced graphene flakes |
| Autor(es): | Diego L. Silva Omar Paranaiba Vilela Neto Ado Jorio de Vasconcelos Luiz Gustavo de Oliveira Lopes Cançado João Luiz Elias Campos Thales Fernando Damasceno Fernandes Jerônimo Nunes Rocha Lucas Resende Pellegrinelli Machado Eder M. Soares Douglas Rodrigues Miquita Hudson Luiz Silva de Miranda Cassiano Rabelo e Silva |
| Resumen: | A metrological framework for statistical analysis of number of layers and stacking order in mass-produced graphene using Raman spectroscopy is presented. The method is based on two complementary protocols, denominated by 2D and G. The 2D–protocol is based on the parameterized principal component analysis of the two-phonon 2D band, and it measures interlayer coupling. A neural-network algorithm for spectral denoising was also developed to improve the outcome. The G–protocol explores the intensity of the bond-stretching G band, and provides information about the number of layers. The method is suitable for automated statistical analysis of heterogeneous graphene-based systems with relatively low computational cost, as shown here for graphene flakes prepared by the liquid-phase exfoliation of graphite. |
| Asunto: | Espectroscopia de Raman Grafeno |
| Idioma: | eng |
| País: | Brasil |
| Editor: | Universidade Federal de Minas Gerais |
| Sigla da Institución: | UFMG |
| Departamento: | CMI - CENTRO DE MICROSCOPIA ENG - DEPARTAMENTO DE ENGENHARIA ELÉTRICA ICX - DEPARTAMENTO DE CIÊNCIA DA COMPUTAÇÃO ICX - DEPARTAMENTO DE FÍSICA |
| Tipo de acceso: | Acesso Restrito |
| Identificador DOI: | https://doi.org/10.1016/j.carbon.2020.01.050 |
| URI: | http://hdl.handle.net/1843/43896 |
| Fecha del documento: | 2020 |
| metadata.dc.url.externa: | https://www.sciencedirect.com/science/article/pii/S0008622320300567#! |
| metadata.dc.relation.ispartof: | Carbon |
| Aparece en las colecciones: | Artigo de Periódico |
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