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Please use this identifier to cite or link to this item: http://hdl.handle.net/1843/43896
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dc.creatorDiego L. Silvapt_BR
dc.creatorOmar Paranaiba Vilela Netopt_BR
dc.creatorAdo Jorio de Vasconcelospt_BR
dc.creatorLuiz Gustavo de Oliveira Lopes Cançadopt_BR
dc.creatorJoão Luiz Elias Campospt_BR
dc.creatorThales Fernando Damasceno Fernandespt_BR
dc.creatorJerônimo Nunes Rochapt_BR
dc.creatorLucas Resende Pellegrinelli Machadopt_BR
dc.creatorEder M. Soarespt_BR
dc.creatorDouglas Rodrigues Miquitapt_BR
dc.creatorHudson Luiz Silva de Mirandapt_BR
dc.creatorCassiano Rabelo e Silvapt_BR
dc.date.accessioned2022-08-02T19:13:28Z-
dc.date.available2022-08-02T19:13:28Z-
dc.date.issued2020-
dc.citation.volume161pt_BR
dc.citation.spage181pt_BR
dc.citation.epage189pt_BR
dc.identifier.doihttps://doi.org/10.1016/j.carbon.2020.01.050pt_BR
dc.identifier.issn0008-6223pt_BR
dc.identifier.urihttp://hdl.handle.net/1843/43896-
dc.description.resumoA metrological framework for statistical analysis of number of layers and stacking order in mass-produced graphene using Raman spectroscopy is presented. The method is based on two complementary protocols, denominated by 2D and G. The 2D–protocol is based on the parameterized principal component analysis of the two-phonon 2D band, and it measures interlayer coupling. A neural-network algorithm for spectral denoising was also developed to improve the outcome. The G–protocol explores the intensity of the bond-stretching G band, and provides information about the number of layers. The method is suitable for automated statistical analysis of heterogeneous graphene-based systems with relatively low computational cost, as shown here for graphene flakes prepared by the liquid-phase exfoliation of graphite.pt_BR
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológicopt_BR
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Geraispt_BR
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superiorpt_BR
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)pt_BR
dc.languageengpt_BR
dc.publisherUniversidade Federal de Minas Geraispt_BR
dc.publisher.countryBrasilpt_BR
dc.publisher.departmentCMI - CENTRO DE MICROSCOPIApt_BR
dc.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA ELÉTRICApt_BR
dc.publisher.departmentICX - DEPARTAMENTO DE CIÊNCIA DA COMPUTAÇÃOpt_BR
dc.publisher.departmentICX - DEPARTAMENTO DE FÍSICApt_BR
dc.publisher.initialsUFMGpt_BR
dc.relation.ispartofCarbonpt_BR
dc.rightsAcesso Restritopt_BR
dc.subjectGraphenept_BR
dc.subjectRaman spectroscopypt_BR
dc.subjectNumber of layerspt_BR
dc.subject.otherEspectroscopia de Ramanpt_BR
dc.subject.otherGrafenopt_BR
dc.titleRaman spectroscopy analysis of number of layers in mass-produced graphene flakespt_BR
dc.typeArtigo de Periódicopt_BR
dc.url.externahttps://www.sciencedirect.com/science/article/pii/S0008622320300567#!pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-1769-0629pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-5978-2735pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-0816-0888pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-8071-0525pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-3868-9029pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-1630-8005pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-5319-4652pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-9946-5224pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-0488-2242pt_BR
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