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Please use this identifier to cite or link to this item: http://hdl.handle.net/1843/55984
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dc.creatorThales Fernando Damasceno Fernandespt_BR
dc.creatorBernardo Ruegger Almeida Nevespt_BR
dc.date.accessioned2023-07-10T12:38:48Z-
dc.date.available2023-07-10T12:38:48Z-
dc.date.issued2016-
dc.citation.volume1pt_BR
dc.citation.issue2pt_BR
dc.citation.spage73pt_BR
dc.citation.epage81pt_BR
dc.identifier.doihttps://dx.doi.org/10.22606/jan.2016.12004pt_BR
dc.identifier.issn25191004pt_BR
dc.identifier.urihttp://hdl.handle.net/1843/55984-
dc.description.resumoThis work explores an atomic force microscopy artifact that yields different topographic data depending on the scanning direction in contact mode. Such artifact is associated with differences in friction coefficients across the sample, which leads to up to 500% difference in topographic data of 2D materials. An analytical theory is used to explain quantitatively this artifact. Nevertheless, on the bright side, such artifact also yields a straightforward methodology, which effectively maps friction coefficients across any 2D material without the need of cantilever spring constant calibration.pt_BR
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológicopt_BR
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Geraispt_BR
dc.description.sponsorshipINCT – Instituto nacional de ciência e tecnologia (Antigo Instituto do Milênio)pt_BR
dc.format.mimetypepdfpt_BR
dc.languageengpt_BR
dc.publisherUniversidade Federal de Minas Geraispt_BR
dc.publisher.countryBrasilpt_BR
dc.publisher.departmentICX - DEPARTAMENTO DE FÍSICApt_BR
dc.publisher.initialsUFMGpt_BR
dc.relation.ispartofJournal of Advances in Nanomaterials-
dc.rightsAcesso Abertopt_BR
dc.subjectAtomic force microscopypt_BR
dc.subjectContact-modept_BR
dc.subjectFriction coefficientpt_BR
dc.subjectEuler-Bernoulli equationpt_BR
dc.subject2D materialspt_BR
dc.subject.otherMicroscopia de força atômicapt_BR
dc.titleFriction coefficient mapping of 2D materials via friction-induced topographic artifact in atomic force microscopypt_BR
dc.typeArtigo de Periódicopt_BR
dc.url.externahttps://dx.doi.org/10.22606/jan.2016.12004pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-3868-9029pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-0464-4754pt_BR
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