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http://hdl.handle.net/1843/56034| Type: | Artigo de Periódico |
| Title: | Gypsum: an environment-friendly, inexpensive and robust height calibration standard at nanometre-scale for atomic force microscopy |
| Authors: | Ana Paula Moreira Barboza Joyce Cristina da Cruz Santos Elisangela Silva Pinto Bernardo Ruegger Almeida Neves |
| Abstract: | Gypsum is an Earth-abundant mineral with enormous applications in agriculture and civil engineering. Here, we show it is also an excellent height calibration standard alternative for atomic force microscopy (AFM). Using plain water as etchant, gypsum flakes readily review 0.75 nm tall terraces which are easy to image (lateral dimensions from tens to hundreds of nanometers) and robust against time in ambient conditions. Therefore, the present work demonstrates a new height standard alternative which is easily-available for all AFM microscopists around the world. |
| Subject: | Microscopia de força atômica Mineral |
| language: | eng |
| metadata.dc.publisher.country: | Brasil |
| Publisher: | Universidade Federal de Minas Gerais |
| Publisher Initials: | UFMG |
| metadata.dc.publisher.department: | ICX - DEPARTAMENTO DE FÍSICA |
| Rights: | Acesso Restrito |
| metadata.dc.identifier.doi: | https://doi.org/10.1088/1361-6528/ab5ded |
| URI: | http://hdl.handle.net/1843/56034 |
| Issue Date: | 2019 |
| metadata.dc.url.externa: | https://iopscience.iop.org/article/10.1088/1361-6528/ab5ded |
| metadata.dc.relation.ispartof: | Nanotechnology |
| Appears in Collections: | Artigo de Periódico |
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