Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits
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Universidade Federal de Minas Gerais
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Artigo de periódico
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Today's integrated circuits are liable to operate under transient faults created either by radiation or malicious sources of perturbation. Among the many techniques for the detection of transient faults, Bulk Built-In Current Sensors (BBICS) present attractive low-cost and efficient features for the protection of circuits. This article provides a survey of published BBICS architectures and compares them with regard to their sensitivities in detecting transient faults. Moreover, a new dynamic BBICS architecture is introduced with improved detection sensitivity, negligible power consumption, and reduced area overhead.
Abstract
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Circuitos eletrônicos, Confiabilidade (Engenharia)
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Bulk Built-In-Current Sensors, Bulk-BICS, Design for Reliability
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https://www.sciencedirect.com/science/article/pii/S0026269217306882