Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits

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dc.creatorRodrigo Possamai Bastos
dc.creatorLeonel Acunha Guimarães
dc.creatorFrank Sill Torres
dc.creatorLaurent Fesquet
dc.date.accessioned2025-04-24T18:18:58Z
dc.date.accessioned2025-09-08T23:47:59Z
dc.date.available2025-04-24T18:18:58Z
dc.date.issued2018
dc.identifier.doihttps://doi.org/10.1016/j.mejo.2017.11.006
dc.identifier.issn0026-2692
dc.identifier.urihttps://hdl.handle.net/1843/81821
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofMicroelectronics journal
dc.rightsAcesso Restrito
dc.subjectCircuitos eletrônicos
dc.subjectConfiabilidade (Engenharia)
dc.subject.otherBulk Built-In-Current Sensors
dc.subject.otherBulk-BICS
dc.subject.otherDesign for Reliability
dc.titleArchitectures of bulk built-in current sensors for detection of transient faults in integrated circuits
dc.typeArtigo de periódico
local.citation.epage79
local.citation.spage70
local.citation.volume71
local.description.resumoToday's integrated circuits are liable to operate under transient faults created either by radiation or malicious sources of perturbation. Among the many techniques for the detection of transient faults, Bulk Built-In Current Sensors (BBICS) present attractive low-cost and efficient features for the protection of circuits. This article provides a survey of published BBICS architectures and compares them with regard to their sensitivities in detecting transient faults. Moreover, a new dynamic BBICS architecture is introduced with improved detection sensitivity, negligible power consumption, and reduced area overhead.
local.publisher.countryBrasil
local.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA ELETRÔNICA
local.publisher.initialsUFMG
local.url.externahttps://www.sciencedirect.com/science/article/pii/S0026269217306882

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