Low overhead in situ aging monitoring and proactive aging management

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dc.creatorChristoph Niemann
dc.creatorFrank Sill Torres
dc.creatorDirk Timmermann
dc.creatorTim Wegner
dc.date.accessioned2025-03-24T14:15:01Z
dc.date.accessioned2025-09-09T00:22:54Z
dc.date.available2025-03-24T14:15:01Z
dc.date.issued2016
dc.identifier.doi10.1109/ISCAS.2016.7539174
dc.identifier.urihttps://hdl.handle.net/1843/80847
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.rightsAcesso Restrito
dc.subjectCircuitos integrados
dc.subjectCircuitos eletrônicos
dc.subjectCircuitos de sinais mistos
dc.subject.otherDesign for Reliability
dc.subject.otherProactive Management , Running Time , Supply Voltage , Propagation Delay , CMOS Technology , Current State Of The System , Map Tasks , Circuitry , Lookup Table , Specific Technology , Higher Layers , Technological Capabilities , Active Switches , Hot Electrons , Component Reliability , Regulatory Switch , Minimal Overhead , System Lifetime , Mean Time To Failure
dc.subject.otherAging , Temperature measurement , Monitoring , Degradation , Delays , Propagation delay
dc.titleLow overhead in situ aging monitoring and proactive aging management
dc.typeArtigo de evento
local.citation.epage2802
local.citation.spage2799
local.description.resumoPost-Dennard scaling CMOS technologies suffer from considerable degradation due to increasing electrical fields caused by the lack of further reduction of the supply voltage. This aspect of aging is widely disregarded so far and cannot be addressed at design time by adding static margins anymore. Instead, it needs to be counteracted effectively at run time over the entire device lifetime. For this purpose, dynamic runtime approaches for aging management are required, relying on detailed in formation regarding the current system state. In this paper we propose a novel aging monitoring mechanism providing that crucial information at a marginal resource overhead. The current device degradation is measured via the aging-dependent delay variation, which can be quantified in situ with built-in tests exploiting the strictly monotonic relation between supply voltage and propagation delay. Furthermore, we suggest to utilize the information gained this way for a proactive aging-aware task mapping.
local.publisher.countryBrasil
local.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA ELETRÔNICA
local.publisher.initialsUFMG
local.url.externahttps://ieeexplore.ieee.org/document/7539174

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