Photoelastic and finite element stress analysis reliability for implant-supported system stress investigation

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dc.creatorAnna Gabriella Camacho Presotto
dc.creatorValentim Adelino Ricardo Barão
dc.creatorRicardo Armini Caldas
dc.creatorCláudia Lopes Brilhante Bhering
dc.creatorRafael Leonardo Xediek Consani
dc.creatorMarcelo Ferraz Mesquita
dc.date.accessioned2022-09-24T17:37:43Z
dc.date.accessioned2025-09-08T23:31:32Z
dc.date.available2022-09-24T17:37:43Z
dc.date.issued2018-07-16
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
dc.description.sponsorshipFAPESP - Fundação de Amparo à Pesquisa do Estado de São Paulo
dc.format.mimetypepdf
dc.identifier.doihttps://doi.org/10.20396/bjos.v17i0.8652941
dc.identifier.issn16773225
dc.identifier.urihttps://hdl.handle.net/1843/45447
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofBrazilian Journal of Oral Sciences
dc.rightsAcesso Aberto
dc.subjectBiomechanical phenomena
dc.subjectDental Implants
dc.subjectOptical phenomena
dc.subjectFinite element analysis
dc.subject.otherBiomechanical phenomena
dc.subject.otherDental Implants
dc.subject.otherOptical phenomena
dc.subject.otherFinite element analysis
dc.titlePhotoelastic and finite element stress analysis reliability for implant-supported system stress investigation
dc.typeArtigo de periódico
local.citation.epage13
local.citation.spage1
local.citation.volume17
local.description.resumoAim: To compare the reliability between photoelastic and finite element (FE) analyses by evaluating the effect of different marginal misfit levels on the stresses generated on two different implant-supported systems using conventional and short implants. Methods: Two photoelastic models were obtained: model C with two conventional implants (4.1×11 mm); and model S with a conventional and a short implant (5×6 mm). Three-unit CoCr frameworks were fabricated simulating a superior first pre-molar (P) to first molar (M) fixed dental prosthesis. Different levels of misfit (μm) were selected based on the misfit average of 10 frameworks obtained by the single-screw test protocol: low (<20), medium (>20 and <40) and high (>40). Stress levels and distribution were measured by photoelastic analysis. A similar situation of the in vitro assay was designed and simulated by the in silico analysis. Maximum and minimum principal strain were recorded numerically and color-coded for the models. Von Mises Stress was obtained for the metallic components. Results:Photoelasticity and FE analyses showed similar tendency where the increase of misfit generates higher stress levels despite of the implant design. The short implant showed lower von Mises stress values; however, it presented stresses around its full length for the in vitro and in silico analysis. Also, model S showed higher μstrain values for all simulated misfit levels. The type of implant did not affect the stresses around pillar P. Conclusions:Photoelasticity and FEA are reliable methodologies presenting similarity for the investigation of the biomechanical behavior of implant-supported rehabilitations.
local.publisher.countryBrasil
local.publisher.departmentFAO - DEPARTAMENTO DE ODONTOLOGIA RESTAURADORA
local.publisher.initialsUFMG
local.url.externahttps://periodicos.sbu.unicamp.br/ojs/index.php/bjos/article/view/8652941/0

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