Retrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X-ray reflection analysis
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Universidade Federal de Minas Gerais
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Resumo
The development of materials is strongly related to our capability of
understanding thermal, mechanical and chemical processing on the nanoscale.
Unravelling the interface structure is crucial for opening new regimes in
property–performance space. Interface arrangements have been characterized
by statistically limited microscopy techniques. In this work, a large-angularrange detector was used for synchrotron diffraction measurements on
commercially pure Mg. Long acquisitions allowed the retrieval of preferred
interface configurations through the observation of extraordinary diffraction
peaks located close to the Mg 102, 200, 204 and 300 fundamental reflections. A
kinematical simulation scanning possible interface structures established the
correspondence of the non-bulk peaks to the interfacial organization of atoms
that may be responsible for their appearance. Simulated interfaces were probed
for a wide range of angular displacements with respect to the main cleavage
planes. The results indicate configurations that allow the observation of X-ray
diffraction, representing a long-range-ordered pattern of atomic distributions in
Mg. The introduced methodology allows for nondestructive monitoring of
systems that undergo processes that modify grain sizes and grain-interface
orientation.
Abstract
Assunto
Raios X, difração, Radiação sincrotrônica, Materiais policristalinos
Palavras-chave
X-ray diffraction, Synchrotron radiation, Extraordinary reflections
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https://scripts.iucr.org/cgi-bin/paper?S1600576720007803