Retrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X-ray reflection analysis

Página do item simplificado
dc.creatorLorena Aarão Rodrigues
dc.creatorAugusta Cerceau Isaac Neta
dc.creatorRoberto Braga Figueiredo
dc.creatorÂngelo Malachias de Souza
dc.date.accessioned2023-06-05T12:12:29Z
dc.date.accessioned2025-09-08T22:48:21Z
dc.date.available2023-06-05T12:12:29Z
dc.date.issued2020
dc.description.sponsorshipCNPq - Conselho Nacional de Desenvolvimento Científico e Tecnológico
dc.description.sponsorshipFAPEMIG - Fundação de Amparo à Pesquisa do Estado de Minas Gerais
dc.description.sponsorshipCAPES - Coordenação de Aperfeiçoamento de Pessoal de Nível Superior
dc.identifier.doihttps://doi.org/10.1107/S1600576720007803
dc.identifier.issn1600-5767
dc.identifier.urihttps://hdl.handle.net/1843/54486
dc.languageeng
dc.publisherUniversidade Federal de Minas Gerais
dc.relation.ispartofJournal of Applied Crystallography
dc.rightsAcesso Restrito
dc.subjectRaios X, difração
dc.subjectRadiação sincrotrônica
dc.subjectMateriais policristalinos
dc.subject.otherX-ray diffraction
dc.subject.otherSynchrotron radiation
dc.subject.otherExtraordinary reflections
dc.titleRetrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X-ray reflection analysis
dc.typeArtigo de periódico
local.citation.epage1014
local.citation.issue4
local.citation.spage1006
local.citation.volume53
local.description.resumoThe development of materials is strongly related to our capability of understanding thermal, mechanical and chemical processing on the nanoscale. Unravelling the interface structure is crucial for opening new regimes in property–performance space. Interface arrangements have been characterized by statistically limited microscopy techniques. In this work, a large-angularrange detector was used for synchrotron diffraction measurements on commercially pure Mg. Long acquisitions allowed the retrieval of preferred interface configurations through the observation of extraordinary diffraction peaks located close to the Mg 102, 200, 204 and 300 fundamental reflections. A kinematical simulation scanning possible interface structures established the correspondence of the non-bulk peaks to the interfacial organization of atoms that may be responsible for their appearance. Simulated interfaces were probed for a wide range of angular displacements with respect to the main cleavage planes. The results indicate configurations that allow the observation of X-ray diffraction, representing a long-range-ordered pattern of atomic distributions in Mg. The introduced methodology allows for nondestructive monitoring of systems that undergo processes that modify grain sizes and grain-interface orientation.
local.identifier.orcidhttps://orcid.org/0000-0001-8617-0956
local.identifier.orcidhttps://orcid.org/0000-0002-8703-4283
local.publisher.countryBrasil
local.publisher.departmentENG - DEPARTAMENTO DE ENGENHARIA METALÚRGICA
local.publisher.departmentICX - DEPARTAMENTO DE FÍSICA
local.publisher.initialsUFMG
local.url.externahttps://scripts.iucr.org/cgi-bin/paper?S1600576720007803

Arquivos

Licença do pacote

Agora exibindo 1 - 1 de 1
Imagem de Miniatura
Nome:
License.txt
Tamanho:
1.99 KB
Formato:
Plain Text
Descrição:
Baixar

Coleções

Artigo de Periódico

Logo UFMG