A transformada de Hough aplicada à difração de elétrons retroespalhados

Abstract

This monograph aims to address the use of the Hough Transform applied to Electron Backscattered Diffraction (EBSD). The EBSD technique used in the scanning electron microscope is based on the interaction of the electron beam with the sample. Among other phenomena, this interaction causes a diffraction of electrons due to the crystalline characteristic of the analyzed phase. Electron diffraction (EBSD) is nowadays one of the most important and powerful techniques to analyze grains in the mineral, metallurgical and material science areas. The images produced are analyzed by a software that uses the Hough Transform as a fundamental tool to index data. Due to the effectiveness of this transform to detect geometric shapes, after indexing crystallographic planes, it allows phase and grain boundary identification, texture analysis, and other features.This monograph seeks to address briefly the physical and mathematical knowledge to understand how helpful it is to use the Hough Transform for EBSD.