Current sharing dynamics during IGBT ZVS turn-on in a hybrid Si IGBT/SiC MOSFET switch

Carregando...
Imagem de Miniatura

Data

Título da Revista

ISSN da Revista

Título de Volume

Editor

Universidade Federal de Minas Gerais

Descrição

Tipo

Artigo de evento

Título alternativo

Primeiro orientador

Membros da banca

Resumo

This article describes the current sharing dynamics of a 1200V Si IGBT/SiC MOSFET hybrid switch for Aircraft Applications. Different switching sequences are utilized to switch the Si IGBT at zero voltage in order to reduce total losses. However, during these switching instants, two effects are usually neglected or are not well taken into account. The first is extra conduction losses during the period where SiC MOSFET conducts all the current to ensure IGBT soft switching. The second one is that the current in the IGBT slowly rises after it turns on due to parasitic inductance between IGBT, SiC MOSFET and diode. The focus of this work is to discuss and precisely model these effects and their impact in hybrid switch losses. A method to measure the dynamic behavior of this hybrid switch and precisely determine associated losses is presented and experimentally verified.

Abstract

Assunto

Eletrônica de potência

Palavras-chave

Insulated gate bipolar transistors , Semiconductor device modeling , MOSFET , Inductance , Semiconductor device measurement , Silicon carbide , Europe, SiC MOSFET , IGBT , Power semiconductor device , Paralleling , Parasitic Inductance, Hybrid Switch, Current Dynamics , MOSFET Switches , Si Hybrid , Total Loss , Conduction Loss , Silicon Carbide , Switching Loss , Extra Loss , Parasitic Inductance , Silicon Carbide MOSFET , Low Voltage , Power Loss , Function Of Frequency , Duty Cycle , Lower Side , Voltage Drop , Series Resistance , Power Conversion , Test Setup , Extra Energy , Gallium Nitride , Dead Time , Current Transfer , Switching Frequency , Blocking Voltage , Forward Bias , Switching Pattern , Thermal Balance , Current Waveforms

Citação

Curso

Endereço externo

https://ieeexplore.ieee.org/document/10264663

Avaliação

Revisão

Suplementado Por

Referenciado Por