Please use this identifier to cite or link to this item: http://hdl.handle.net/1843/43896
Type: Artigo de Periódico
Title: Raman spectroscopy analysis of number of layers in mass-produced graphene flakes
Authors: Diego L. Silva
Omar Paranaiba Vilela Neto
Ado Jorio de Vasconcelos
Luiz Gustavo de Oliveira Lopes Cançado
João Luiz Elias Campos
Thales Fernando Damasceno Fernandes
Jerônimo Nunes Rocha
Lucas Resende Pellegrinelli Machado
Eder M. Soares
Douglas Rodrigues Miquita
Hudson Luiz Silva de Miranda
Cassiano Rabelo e Silva
Abstract: A metrological framework for statistical analysis of number of layers and stacking order in mass-produced graphene using Raman spectroscopy is presented. The method is based on two complementary protocols, denominated by 2D and G. The 2D–protocol is based on the parameterized principal component analysis of the two-phonon 2D band, and it measures interlayer coupling. A neural-network algorithm for spectral denoising was also developed to improve the outcome. The G–protocol explores the intensity of the bond-stretching G band, and provides information about the number of layers. The method is suitable for automated statistical analysis of heterogeneous graphene-based systems with relatively low computational cost, as shown here for graphene flakes prepared by the liquid-phase exfoliation of graphite.
Subject: Espectroscopia de Raman
Grafeno
language: eng
metadata.dc.publisher.country: Brasil
Publisher: Universidade Federal de Minas Gerais
Publisher Initials: UFMG
metadata.dc.publisher.department: CMI - CENTRO DE MICROSCOPIA
ENG - DEPARTAMENTO DE ENGENHARIA ELÉTRICA
ICX - DEPARTAMENTO DE CIÊNCIA DA COMPUTAÇÃO
ICX - DEPARTAMENTO DE FÍSICA
Rights: Acesso Restrito
metadata.dc.identifier.doi: https://doi.org/10.1016/j.carbon.2020.01.050
URI: http://hdl.handle.net/1843/43896
Issue Date: 2020
metadata.dc.url.externa: https://www.sciencedirect.com/science/article/pii/S0008622320300567#!
metadata.dc.relation.ispartof: Carbon
Appears in Collections:Artigo de Periódico

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